Design and Implementation of an Automatic System for Dielectric Characterization of Ceramic Materials

Abstract

This article describes the design and implementation of an automatic dielectric characterization system by using the non-destructive technique of the complex impedance spectroscopy. This method allows obtaining the dielectric constant and the complex impedance for a wide range of temperatures and different frequencies of the applied field. The developed user interface eases the configuration of two impedance analyzers and the setup of the characterization test. Additionally, test reports are automatically generated from the measurements, which simplify the experimental analysis by plotting the more important parameters in the dielectric characterization. One of these parameters, the peak of the graph Er´ (real part of the dielectric constant) vs. temperature, which is the phase transition temperature from the ferroelectric to the paraelectric state of the ceramic materials, is obtained and compared to reference values to demonstrate the system correct functioning.